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A unique calibration pattern for spatial and conductive modes in Atomic Force Microscopes

The CSIC has developed an easy procedure for manufacturing calibration patterns suitable for Atomic Force Microscopes (AFM). A unique pattern supports a simultaneous geometrical and current calibration for the sample.

 

Atomic-force microscopy (AFM) can ‘observe’ the characteristics of materials at the nanoscale.Atomic-force microscopy (AFM) can ‘observe’ the characteristics of materials at the nanoscale. It detects the atomic forces of the material. The information is collected by a kind of needle, a probe, that ‘feels’ the atomic forces without touching the surface of the material, and transmit them to the electronic circuitry.

One of the most commonly challenge encountered when using an Atomic Force Microscope (AFM) is its calibration. Although, for the spatial calibration, there are different types of standard samples or calibration patterns, which are generally supplied by AFM equipment manufacturers, for calibration of other AFM measurement modes, in particular when the system is used for electrical current measurement (c-AFM), no standards samples have been commercially available.

CSIC scientists have developed a method that allows an easy fabrication of calibration pattern for an AFM that simultaneously support it in geometry and conductive mode make it very suitable to be rapidly implemented as
standard setup in commercial AFM equipment. Industrial partners from manufacturing industry of Atomic Force Microscopes are being sought to collaborate through a patent licence agreement.

Contact:

Isabel Gavilanes-Pérez
Deputy Vice-Presidency for
Knowledge Transfer - CSIC
Tel.: 93 594 77 00
This email address is being protected from spambots. You need JavaScript enabled to view it.

The CSIC has developed an easy procedure for manufacturing calibration patterns suitable for Atomic Force Microscopes (AFM). A unique pattern supports a simultaneous geometrical and current calibration for the sample.